[Intel-gfx] [PATCH i-g-t v2] tests/gem_render_linear_blits: split into two subtests

[Chris Wilson]

On Wed, Feb 25, 2015 at 04:11:18PM +0000, tim.gore at intel.com wrote:
> From: Tim Gore <tim.gore at intel.com>
> 
> The gem_render_linear_blits test tends to get oom killed
> on low memory (< 4GB) Android systems. This is because the
> test tries to allocate (sysinfo.totalram * 9 / 10) in
> buffer objects and the remaining 10% of memory is not
> always enough for the Android system.
> After a discussion with Chris Wilson I have split this
> test into a "basic" and an "apperture-thrash" subtest,
> in the same way as gem_linear_blits. The basic test
> uses just two buffer objects and the apperture-thrash
> test is skipped if there is insuffiecient memory.
> 
> v2: Following comment from Chris Wilson:
>     a) Remove the command line option for count.
>     b) Add a third subtest to ensure swap is tested
> 
> Signed-off-by: Tim Gore <tim.gore at intel.com>

Looks fine to me. Thomas may sweep in later and and fine tune the buffer
count required to thrash swap, but it looks good to go as is.
-Chris

-- 
Chris Wilson, Intel Open Source Technology Centre