[igt-dev] [PATCH i-g-t v3 1/2] tests/kms_flip: Set duration for subtest from command line

[Kahola, Mika]

On Thu, 2018-11-08 at 12:47 +0100, Maarten Lankhorst wrote:
> Op 09-08-18 om 12:12 schreef Mika Kahola:
> > To reduce the execution time of kms_flip test on CI, let's move
> > subtest
> > duration parameter as command line option. The default subtest
> > duration
> > is 3 seconds for test that require jitter computation and for the
> > rest
> > of the subtests are run only once.
> > 
> > v2: Run each subtest only once (default action)
> > v3: Reduces default timeout for tests that require jitter
> > computation (Ville)
> > 
> > Signed-off-by: Mika Kahola <mika.kahola at intel.com>
> 
> I think this is the wrong approach. What we really want to do is kill
> tests from kms_flip
> instead and move them to separate places.
> 
> Killing off all the interruptible tests would save 50% of the time.
> So all we have to do is
> making sure that we have tests that test the missing ioctl's in in
> kms_atomic_interruptible,
> and we would save 50% of the time.
kms_atomic_interruptible would probably be more logical place for
interrupt tests. I agree that it would reduce the execution time of the
kms_flip test but in the end of the day we still need to run those
interruptible tests and therefore we would end up increasing the
execution time of the kms_atomic_interruptible test.

Do you feel that we could have overall reduction in test execution if
we move these interruptible tests out from kms_flip? Maybe kms_flip
readability would improve and therefore worth the effort?
> 
> After that we have to get rid of the unrelated tests to make the code
> more readable..
> nonexisting-fb, dpms-vs-vblank-race, modeset-vs-vblank-race and bo-
> too-big would be
> better off in a separate testcase.
> 
> Same for bad-tiling, but I already had a patch for that.
> https://patchwork.freedesktop.org/patch/259361/
> 
> This would clean up kms_flip a lot, and make the test more readable.
>