[igt-dev] [PATCH v7 0/2] Add a new test for driver/device hot reload

Janusz Krzysztofik janusz.krzysztofik at linux.intel.com
Wed Apr 10 10:05:32 UTC 2019


On Wednesday, April 10, 2019 12:02:24 PM CEST Janusz Krzysztofik wrote:
> The test should help resolving driver bugs which exhibit themselves
> when a device is unplugged / driver unbind from a device while the
> device is busy (different from simple module unload which requires
> device references being put first).
> 
> Janusz Krzysztofik (2):
>   tests: Add a new test for driver/device hot reload
>   tests/core_hot_reload: Accept external workload
> 
>  tests/Makefile.sources  |   1 +
>  tests/core_hot_reload.c | 305 ++++++++++++++++++++++++++++++++++++++++
>  tests/meson.build       |   1 +
>  3 files changed, 307 insertions(+)
>  create mode 100644 tests/core_hot_reload.c
> 
> 
> Last time (submission marked as v5) I tried to restore original
> version numbering since initial internal submission and I failed,
> sorry.  There was one more public submission I missed, that's why
> we now have v7, not v6, sorry.

I messed it up again,  Sorry for versions of patches not matching that of the 
cover letter.

Janusz


> 
> I've also rearranged v5->v6 description to better reflect ideas
> standing behind, and credited authors of comments, requests and
> suggestions I followed.
> 
> 
> Changelog:
> v6->v7:
> - add missing igt_exit() needed with the second patch.
> 
> v5->v6 (third public submission, incorrectly marked as v5, sorry):
> - run workload inside an igt helper subprocess so resources consumed
>   by the workload are cleaned up automatically on workload subprocess
>   crash, without affecting test results,
> - move the igt helper with workload back from subtests to initial
>   fixture so workload crash also does not affect test results,
> - re-add the second patch which extends the test with an option for
>   using an external command as a workload,
> - other cleanups suggested by Kasia and Chris.
> 
> v4->v5 (second public submission, marked as v2):
> - try to restore the device to a working state after each subtest
>   (Peter, Daniel).
> 
> v3->v4 (first public submission, not marked with any version number):
> - run dummy_workolad from inside subtests (Antonio).
> 
> v2->v3 (internal submission):
> - run dummy_workload from the test process directly (Antonio),
> - drop the patch for running external workload (Antonio).
> 
> v1->v2 (internal submission):
> - run a subprocess with dummy_workload instead of external command
>   (Antonio),
> - keep use of external workload command as an option, move that to a
>   separate patch.






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