[igt-dev] [PATCH i-g-t 4/5] lib/tests: Convert no_exit tests into positive tests

[Arkadiusz Hiler]

On Tue, Feb 19, 2019 at 08:57:15AM +0100, Daniel Vetter wrote:
> This way we can make sure they die with an assert, which is what we
> want.
> 
> Signed-off-by: Daniel Vetter <daniel.vetter at intel.com>
> ---
>  lib/tests/igt_no_exit.c           | 50 ++++++++++++++++++++++++++++++-
>  lib/tests/igt_no_exit_list_only.c | 41 -------------------------
>  lib/tests/meson.build             | 17 +++++------
>  3 files changed, 57 insertions(+), 51 deletions(-)
>  delete mode 100644 lib/tests/igt_no_exit_list_only.c
> 
> diff --git a/lib/tests/igt_no_exit.c b/lib/tests/igt_no_exit.c
> index dc89b8302a71..4a777412b6a9 100644
> --- a/lib/tests/igt_no_exit.c
> +++ b/lib/tests/igt_no_exit.c
> @@ -25,9 +25,26 @@
>   *
>   */
>  
> +#include <sys/wait.h>
> +
>  #include "drmtest.h"
>  
> -int main(int argc, char **argv)
> +#include "igt_tests_common.h"
> +
> +static void no_exit_list_only(void)
> +{
> +	char prog[] = "igt_list_only";
> +	char arg[] = "--list-subtests";
> +	char *fake_argv[] = {prog, arg};
> +	int fake_argc = 2;

ARRAY_SIZE(fake_argv) ?

Reviewed-by: Arkadiusz Hiler <arkadiusz.hiler at intel.com>