[igt-dev] [PATCH i-g-t v3 12/19] tests/core_hotunplug: Fail subtests on device close errors

[Janusz Krzysztofik]

Since health checks are now run from follow-up fixture sections, it is
safe to fail subtests without the need to abort the test execution.  Do
that on device close errors instead of just emitting warnings.

v3: Refresh.

Signed-off-by: Janusz Krzysztofik <janusz.krzysztofik at linux.intel.com>
Reviewed-by: Michał Winiarski <michal.winiarski at intel.com>
---
 tests/core_hotunplug.c | 3 +++
 1 file changed, 3 insertions(+)

diff --git a/tests/core_hotunplug.c b/tests/core_hotunplug.c
index 145593683..e048f3a15 100644
--- a/tests/core_hotunplug.c
+++ b/tests/core_hotunplug.c
@@ -153,6 +153,7 @@ static void device_unplug(struct hotunplug *priv, const char *prefix)
 	igt_reset_timeout();
 
 	priv->fd.sysfs_dev = close_sysfs(priv->fd.sysfs_dev);
+	igt_assert_eq(priv->fd.sysfs_dev, -1);
 }
 
 /* Re-discover the device by rescanning its bus */
@@ -270,6 +271,7 @@ static void hotunbind_lateclose(struct hotunplug *priv)
 
 	igt_debug("late closing the unbound device instance\n");
 	priv->fd.drm = close_device(priv->fd.drm);
+	igt_assert_eq(priv->fd.drm, -1);
 }
 
 static void hotunplug_lateclose(struct hotunplug *priv)
@@ -282,6 +284,7 @@ static void hotunplug_lateclose(struct hotunplug *priv)
 
 	igt_debug("late closing the removed device instance\n");
 	priv->fd.drm = close_device(priv->fd.drm);
+	igt_assert_eq(priv->fd.drm, -1);
 }
 
 /* Main */
-- 
2.21.1