[igt-dev] [PATCH i-g-t v5 12/21] tests/core_hotunplug: Fail subtests on device close errors
Janusz Krzysztofik
janusz.krzysztofik at linux.intel.com
Fri Aug 28 07:59:18 UTC 2020
Since health checks are now run from follow-up fixture sections, it is
safe to fail subtests without the need to abort the test execution. Do
that on device close errors instead of just emitting warnings.
v2: Rebase only.
v3: Refresh.
v4: Refresh.
Signed-off-by: Janusz Krzysztofik <janusz.krzysztofik at linux.intel.com>
Reviewed-by: Michał Winiarski <michal.winiarski at intel.com>
---
tests/core_hotunplug.c | 3 +++
1 file changed, 3 insertions(+)
diff --git a/tests/core_hotunplug.c b/tests/core_hotunplug.c
index b72361900..dd1dc1fe0 100644
--- a/tests/core_hotunplug.c
+++ b/tests/core_hotunplug.c
@@ -154,6 +154,7 @@ static void device_unplug(struct hotunplug *priv, const char *prefix)
igt_reset_timeout();
priv->fd.sysfs_dev = close_sysfs(priv->fd.sysfs_dev);
+ igt_assert_eq(priv->fd.sysfs_dev, -1);
}
/* Re-discover the device by rescanning its bus */
@@ -276,6 +277,7 @@ static void hotunbind_lateclose(struct hotunplug *priv)
igt_debug("late closing the unbound device instance\n");
priv->fd.drm = close_device(priv->fd.drm);
+ igt_assert_eq(priv->fd.drm, -1);
healthcheck(priv);
}
@@ -291,6 +293,7 @@ static void hotunplug_lateclose(struct hotunplug *priv)
igt_debug("late closing the removed device instance\n");
priv->fd.drm = close_device(priv->fd.drm);
+ igt_assert_eq(priv->fd.drm, -1);
healthcheck(priv);
}
--
2.21.1
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