[igt-dev] [V5 i-g-t 49/81] tests/kms_flip_event_leak: Document each subtest for testplan

[Karthik B S]

On 6/29/2023 8:18 PM, Bhanuprakash Modem wrote:
> Add documentation for all kms tests which is used by IGT testplan
> documentation.
>
> Signed-off-by: Bhanuprakash Modem <bhanuprakash.modem at intel.com>
> ---
>   tests/kms_flip_event_leak.c | 19 +++++++++++++++++++
>   1 file changed, 19 insertions(+)
>
> diff --git a/tests/kms_flip_event_leak.c b/tests/kms_flip_event_leak.c
> index 423ce40df..a1b614771 100644
> --- a/tests/kms_flip_event_leak.c
> +++ b/tests/kms_flip_event_leak.c
> @@ -30,6 +30,25 @@
>   
>   #include "igt_device.h"
>   #include "xe/xe_query.h"
> +/**
> + * TEST: kms flip event leak
> + * Category: Display
> + * Description: This test tries to provoke the kernel into leaking a pending
> + *              page flip event when the fd is closed before the flip has
> + *              completed. The test itself won't fail even if the kernel leaks
> + *              the event, but the resulting dmesg WARN will indicate a failure.
> + *
> + * SUBTEST: basic
> + * Description: This test tries to provoke the kernel into leaking a pending
> + *              page flip event when the fd is closed before the flip has
> + *              completed. The test itself won't fail even if the kernel leaks
> + *              the event, but the resulting dmesg WARN will indicate a failure.

Hi,

The test and subtest description are same? I understand that there is 
only one subtest currently, but could the test description be updated to 
be more a high level description may be?

Thanks,
Karthik.B.S
> + * Driver requirement: any
> + * Functionality: kms_core
> + * Mega feature: General Display Features
> + * Run type: FULL
> + * Test category: functionality test
> + */
>   
>   typedef struct {
>   	int drm_fd;