[igt-dev] [V5 i-g-t 74/81] tests/kms_sysfs_edid_timing: Document each subtest for testplan

[Sharma, Swati2]

On 29-Jun-23 8:19 PM, Bhanuprakash Modem wrote:
> Add documentation for all kms tests which is used by IGT testplan
> documentation.
> 
> Signed-off-by: Bhanuprakash Modem <bhanuprakash.modem at intel.com>
> ---
>   tests/kms_sysfs_edid_timing.c | 21 +++++++++++++++++++++
>   1 file changed, 21 insertions(+)
> 
> diff --git a/tests/kms_sysfs_edid_timing.c b/tests/kms_sysfs_edid_timing.c
> index 775211089..e185eaf6d 100644
> --- a/tests/kms_sysfs_edid_timing.c
> +++ b/tests/kms_sysfs_edid_timing.c
> @@ -25,6 +25,27 @@
>   #include <dirent.h>
>   #include <fcntl.h>
>   #include <sys/stat.h>
> +/**
> + * TEST: kms sysfs edid timing
> + * Category: Display
> + * Description: This test checks the time it takes to reprobe each connector and
> + *              fails if either the time it takes for one reprobe is too long or
> + *              if the mean time it takes to reprobe one connector is too long.
> + *              Additionally, make sure that the mean time for all connectors is
> + *              not too long.
> + *
> + * SUBTEST:

There is no subtest defined in this test, still we are duplicating same 
description for test and subtest. Is this okay?

> + * Description: This test checks the time it takes to reprobe each connector and
> + *              fails if either the time it takes for one reprobe is too long or
> + *              if the mean time it takes to reprobe one connector is too long.
> + *              Additionally, make sure that the mean time for all connectors is
> + *              not too long.
> + * Driver requirement: any
> + * Functionality: kms_core
> + * Mega feature: General Display Features
> + * Run type: FULL
> + * Test category: functionality test
> + */
>   
>   #define THRESHOLD_PER_CONNECTOR		150
>   #define THRESHOLD_PER_CONNECTOR_MEAN	140