[igt-dev] [i-g-t V6 73/81] tests/kms_sysfs_edid_timing: Document each subtest for testplan

[Sharma, Swati2]

LGTM
Reviewed-by: Swati Sharma <swati2.sharma at intel.com>

On 12-Aug-23 12:16 AM, Bhanuprakash Modem wrote:
> Add documentation for all kms tests which is used by IGT testplan
> documentation.
> 
> V2: - Fix test description
> 
> Cc: Swati Sharma <swati2.sharma at intel.com>
> Signed-off-by: Bhanuprakash Modem <bhanuprakash.modem at intel.com>
> ---
>   tests/kms_sysfs_edid_timing.c | 17 +++++++++++++++++
>   1 file changed, 17 insertions(+)
> 
> diff --git a/tests/kms_sysfs_edid_timing.c b/tests/kms_sysfs_edid_timing.c
> index 775211089..0ee50cfe5 100644
> --- a/tests/kms_sysfs_edid_timing.c
> +++ b/tests/kms_sysfs_edid_timing.c
> @@ -25,6 +25,23 @@
>   #include <dirent.h>
>   #include <fcntl.h>
>   #include <sys/stat.h>
> +/**
> + * TEST: kms sysfs edid timing
> + * Category: Display
> + * Description: Test to check the time it takes to reprobe each connector.
> + *
> + * SUBTEST:
> + * Description: This test checks the time it takes to reprobe each connector and
> + *              fails if either the time it takes for one reprobe is too long or
> + *              if the mean time it takes to reprobe one connector is too long.
> + *              Additionally, make sure that the mean time for all connectors is
> + *              not too long.
> + * Driver requirement: any
> + * Functionality: kms_core
> + * Mega feature: General Display Features
> + * Run type: FULL
> + * Test category: functionality test
> + */
>   
>   #define THRESHOLD_PER_CONNECTOR		150
>   #define THRESHOLD_PER_CONNECTOR_MEAN	140