[igt-dev] [PATCH i-g-t] tests/kms_setmode: Fix dynamic subtests
B, Jeevan
jeevan.b at intel.com
Fri Jun 23 04:20:31 UTC 2023
Hi Bhanu,
> -----Original Message-----
> From: Modem, Bhanuprakash <bhanuprakash.modem at intel.com>
> Sent: Friday, June 23, 2023 9:20 AM
> To: B, Jeevan <jeevan.b at intel.com>; igt-dev at lists.freedesktop.org
> Cc: kamil.konieczny at linux.intel.com
> Subject: Re: [PATCH i-g-t] tests/kms_setmode: Fix dynamic subtests
>
> Hi Jeevan,
>
> On Thu-22-06-2023 04:46 pm, Jeevan B wrote:
> > basic-clone-single-crtc and invalid-clone-exclusive-crtc were not part
> > of dynamic subtest so tests were getting skipped. fixed the test to
> > execute skipping tests as expected.
>
> What does it mean these tests are not part of dynamic subtests?
>
> AFAIK, all basic-* tests are positive test cases & there are corresponding
> negative test cases (invalid-*)
>
> If any positive test executed, the corresponding negative test is supposed to
> skip & vice versa.
>
> Example:
> https://intel-gfx-ci.01.org/tree/drm-tip/shards-
> all.html?testfilter=kms_setmode&hosts=shard-glk
>
>
> - basic-close-single-crtc: SKIP
> - invalid-clone-single-crtc: PASS
>
> - clone-executive-crtc: PASS
> - invalid-clone-executive-crtc: SKIP
>
> >
> > v2: add missing call.
> >
> > Signed-off-by: Jeevan B <jeevan.b at intel.com>
> > ---
> > tests/kms_setmode.c | 26 +++++++++++++-------------
> > 1 file changed, 13 insertions(+), 13 deletions(-)
> >
> > diff --git a/tests/kms_setmode.c b/tests/kms_setmode.c index
> > a611d938..96fb0b4b 100644
> > --- a/tests/kms_setmode.c
> > +++ b/tests/kms_setmode.c
> > @@ -647,20 +647,19 @@ static void test_one_combination(const struct
> test_config *tconf,
> > struct crtc_config crtcs[MAX_CRTCS];
> > int crtc_count;
> > bool config_valid;
> > + int i, pos = 0;
> > + char test_name[256];
> >
> > setup_crtcs(tconf, cconfs, connector_count, crtcs,
> > &crtc_count, &config_valid);
> >
> > - if (config_valid == !(tconf->flags & TEST_INVALID)) {
> > - int i, pos = 0;
> > - char test_name[256];
> > -
> > - for (i = 0; i < crtc_count; i++) {
> > - if (i > 0)
> > - pos += snprintf(&test_name[pos],
> ARRAY_SIZE(test_name) - pos, "-");
> > - pos += get_test_name_str(&crtcs[i],
> &test_name[pos], ARRAY_SIZE(test_name) - pos);
> > - }
> > + for (i = 0; i < crtc_count; i++) {
> > + if (i > 0)
> > + pos += snprintf(&test_name[pos],
> ARRAY_SIZE(test_name) - pos, "-");
> > + pos += get_test_name_str(&crtcs[i], &test_name[pos],
> ARRAY_SIZE(test_name) - pos);
> > + }
> >
> > + if (config_valid == !(tconf->flags & TEST_INVALID)) {
> > for (i = 0; i < crtc_count; i++) {
> > struct crtc_config *crtc = &crtcs[i];
> >
> > @@ -679,16 +678,17 @@ static void test_one_combination(const struct
> test_config *tconf,
> > ((i > 0) && (crtc[i - 1].mode.hdisplay >
> MAX_HDISPLAY_PER_CRTC) &&
> > (abs(crtc->crtc_idx - crtcs[i - 1].crtc_idx) <= 1))) {
> > igt_info("Combo: %s is not possible with
> selected mode(s).\n", test_name);
> > - goto out;
> > + cleanup_crtcs(crtcs, crtc_count);
> > + return;
> > }
> > }
> >
> > igt_dynamic_f("%s", test_name)
> > test_crtc_config(tconf, crtcs, crtc_count);
> > + } else {
> > + igt_dynamic_f("%s", test_name)
> > + cleanup_crtcs(crtcs, crtc_count);
>
> We are supposed to execute the test, not a cleanup. This will always throw
> the test result as PASS (which is bogus) without even testing anything.
Understood. I will make the change for this.
>
> - Bhanu
>
> > }
> > -
> > -out:
> > - cleanup_crtcs(crtcs, crtc_count);
> > }
> >
> > static int assign_crtc_to_connectors(const struct test_config
> > *tconf,
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