[PATCH v1] tests/intel: Remove TEST field from test documentation

[Pravalika Gurram]

Each test should contain only one TEST field.

Add the Functionality field in the TEST section
to fix the warnings during the addition of subtests.

Signed-off-by: Pravalika Gurram <pravalika.gurram at intel.com>
---
 tests/intel/xe_vm.c | 10 +---------
 1 file changed, 1 insertion(+), 9 deletions(-)

diff --git a/tests/intel/xe_vm.c b/tests/intel/xe_vm.c
index b10269191..b5519c9fc 100644
--- a/tests/intel/xe_vm.c
+++ b/tests/intel/xe_vm.c
@@ -8,6 +8,7 @@
  * Category: Core
  * Mega feature: General Core features
  * Sub-category: VMA
+ * Functionality: ioctl
  */
 
 #include "igt.h"
@@ -2247,15 +2248,6 @@ static void bind_flag_invalid(int fd)
 	xe_vm_destroy(fd, vm);
 }
 
-/**
- * TEST: Negative test for vm create/destroy ioctl
- * Category: Core
- * Mega feature: General Core features
- * Sub-category: Synchronization
- * Functionality: vm create
- * Test category: negative test
- */
-
 /**
  * SUBTEST: invalid-flag-%s
  * Description:  function %arg[1] used in vm create IOCTL to make it fail
-- 
2.34.1