[PATCH i-g-t v3] tests/intel/xe_oa: Preventing test failures by omitting rc6 disable test if 'gtidle' node is missing

[Soham Purkait]

Rc6 disable test has been modified in order to check for 'gtidle'
node to skip residency tests on VF devices where this node is not
present, preventing test failure.

v3: Commit message fixed (Ashutosh)
    Space added before curly braces (Riana)

Signed-off-by: Soham Purkait <soham.purkait at intel.com>
---
 tests/intel/xe_oa.c | 4 +++-
 1 file changed, 3 insertions(+), 1 deletion(-)

diff --git a/tests/intel/xe_oa.c b/tests/intel/xe_oa.c
index b4dfcced7..92f5828c7 100644
--- a/tests/intel/xe_oa.c
+++ b/tests/intel/xe_oa.c
@@ -4649,8 +4649,10 @@ igt_main
 			test_oa_unit_concurrent_oa_buffer_read();
 	}
 
-	igt_subtest("rc6-disable")
+	igt_subtest("rc6-disable") {
+		igt_require(xe_sysfs_gt_has_node(drm_fd, 0, "gtidle"));
 		test_rc6_disable();
+	}
 
 	igt_subtest_with_dynamic("stress-open-close") {
 		__for_one_hwe_in_oag(hwe)
-- 
2.34.1