[Intel-gfx] [PATCH 3/3] intel: Add regression tests for batch decode.

Daniel Vetter daniel at ffwll.ch
Wed Jan 4 00:24:28 CET 2012

On Tue, Jan 03, 2012 at 03:05:26PM -0800, Eric Anholt wrote:
> The .batch was generated using the dump-a-batch branch of
> git://people.freedesktop.org/~anholt/mesa
> using glxgears on gen7 hardware, using INTEL_DEVID_OVERRIDE for
> non-gen7 (this means that offsets in the buffers for non-gen7 are 0!).
> The .ref was generated by:
> ./test_decode tests/gen7-3d.batch -dump.
> The .sh exists because you can't supply arguments to tests using the
> simple automake tests driver.  Something reasonable could be done
> using automake's parallel-tests driver (in fact, a previous version of
> the patch did that), but I was concerned that:
> 1) The parallel-tests driver is documented to be unstable -- they may
>    change interfaces on us later.
> 2) The parallel-tests driver hides the output of tests in .log files
>    scattered all over the tree, which was ugly and more painful to
>    work with.
> ---
>  intel/Makefile.am                 |   17 +
>  intel/tests/gen7-3d.batch         |  Bin 0 -> 4504 bytes
>  intel/tests/gen7-3d.batch-ref.txt | 1350 +++++++++++++++++++++++++++++++++++++

I'm missing the *.batch* stuff for gen4-gen6 mentioned in the Makefile.am.
>From looking throught the code I've also expected the *.batch to be a
symlink to test-batch.sh.

Otherwise this looks nice. I'm not really sold on this catching bugs, but
it certainly helps in self-documenting patches to the decoder by including
the relevant output changes in the diff.
Daniel Vetter
Mail: daniel at ffwll.ch
Mobile: +41 (0)79 365 57 48

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