[Intel-gfx] [PATCH 3/3] intel: Add regression tests for batch decode.
daniel at ffwll.ch
Wed Jan 4 00:24:28 CET 2012
On Tue, Jan 03, 2012 at 03:05:26PM -0800, Eric Anholt wrote:
> The .batch was generated using the dump-a-batch branch of
> using glxgears on gen7 hardware, using INTEL_DEVID_OVERRIDE for
> non-gen7 (this means that offsets in the buffers for non-gen7 are 0!).
> The .ref was generated by:
> ./test_decode tests/gen7-3d.batch -dump.
> The .sh exists because you can't supply arguments to tests using the
> simple automake tests driver. Something reasonable could be done
> using automake's parallel-tests driver (in fact, a previous version of
> the patch did that), but I was concerned that:
> 1) The parallel-tests driver is documented to be unstable -- they may
> change interfaces on us later.
> 2) The parallel-tests driver hides the output of tests in .log files
> scattered all over the tree, which was ugly and more painful to
> work with.
> intel/Makefile.am | 17 +
> intel/tests/gen7-3d.batch | Bin 0 -> 4504 bytes
> intel/tests/gen7-3d.batch-ref.txt | 1350 +++++++++++++++++++++++++++++++++++++
I'm missing the *.batch* stuff for gen4-gen6 mentioned in the Makefile.am.
>From looking throught the code I've also expected the *.batch to be a
symlink to test-batch.sh.
Otherwise this looks nice. I'm not really sold on this catching bugs, but
it certainly helps in self-documenting patches to the decoder by including
the relevant output changes in the diff.
Mail: daniel at ffwll.ch
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