[Intel-gfx] [PATCH] drm/i915: Handle sync_seqno correctly when seqno has wrapped.

[Chris Wilson]

On Tue, 13 Nov 2012 17:45:14 +0100, Daniel Vetter <daniel at ffwll.ch> wrote:
> trying to engineer a perfect test for the
> single failure mode we now have in front of us might actually reduce
> coverage.

This is a critical point worth remembering when writing tests: Having a
test case that detects a past bug is great, but a test case that
detects a future bug is better.
-Chris.

-- 
Chris Wilson, Intel Open Source Technology Centre