[Intel-gfx] [PATCH i-g-t] tests/gem_tiled_fence_blits: split into subtests

[Chris Wilson]

On Tue, Mar 24, 2015 at 02:16:04PM +0000, tim.gore at intel.com wrote:
> From: Tim Gore <tim.gore at intel.com>
> 
> The gem_tiled_fence_blits test tends to get oom killed
> on low memory (< 4GB) Android systems. This is because the
> test tries to allocate (sysinfo.totalram * 9 / 10) in
> buffer objects and the remaining 10% of memory is not
> always enough for the Android system.
> As with a similar issue with gem_render_linear_blits,
> this problem is resolved by splitting into subtests.
> A "basic" subtest uses minimal memory buffers to test
> the basic operation, and a "normal" subtest which is
> skipped if there is insufficient memory.
> 
> I also took the opportunity to cull some numeric literals.
> 
> Signed-off-by: Tim Gore <tim.gore at intel.com>

Looks good, thanks.
Reviewed-by: Chris Wilson <chris at chris-wilson.co.uk>
-Chris

-- 
Chris Wilson, Intel Open Source Technology Centre