[Intel-gfx] [PATCH i-g-t] tests/gem_flink_basic: Add documentation for subtests

[Vinay Belgaumkar]

Added the missing IGT_TEST_DESCRIPTION and some subtest
descriptions.

Signed-off-by: Vinay Belgaumkar <vinay.belgaumkar at intel.com>
---
 tests/gem_flink_basic.c | 36 ++++++++++++++++++++++++++++++++++++
 1 file changed, 36 insertions(+)

diff --git a/tests/gem_flink_basic.c b/tests/gem_flink_basic.c
index 26ae7d6..8761e0d 100644
--- a/tests/gem_flink_basic.c
+++ b/tests/gem_flink_basic.c
@@ -36,6 +36,8 @@
 #include <sys/ioctl.h>
 #include "drm.h"
 
+IGT_TEST_DESCRIPTION("Tests for flink - a way to export a gem object by name");
+
 static void
 test_flink(int fd)
 {
@@ -155,14 +157,48 @@ igt_main
 	igt_fixture
 		fd = drm_open_driver(DRIVER_INTEL);
 
+	/* basic:
+	This subtest creates a gem object, and then creates
+	a flink. It tests that we can gain access to the gem
+	object using the flink name.
+
+	Test fails if flink creation/open fails.
+	**/
 	igt_subtest("basic")
 		test_flink(fd);
+
+	/* double-flink:
+	This test checks if it is possible to create 2 flinks
+	for the same gem object.
+
+	Test fails if 2 flink objects cannot be created.
+	**/
 	igt_subtest("double-flink")
 		test_double_flink(fd);
+
+	/* bad-flink:
+	Use an invalid flink handle.
+
+	DRM_IOCTL_GEM_FLINK ioctl call should return failure.
+	**/
 	igt_subtest("bad-flink")
 		test_bad_flink(fd);
+
+	/* bad-open:
+	Try to use an invalid flink name.
+
+	DRM_IOCTL_GEM_FLINK ioctl call should return failure.
+	**/
 	igt_subtest("bad-open")
 		test_bad_open(fd);
+
+	/* flink-lifetime:
+	Check if a flink name can be used even after the drm
+	fd used to create it is closed.
+
+	Flink name should remain valid until the gem object
+	it points to has not been freed.
+	**/
 	igt_subtest("flink-lifetime")
 		test_flink_lifetime(fd);
 }
-- 
1.9.1