[Intel-gfx] [PATCH i-g-t] kms_atomic_transition: Split out modeset tests on internal panels

[Chris Wilson]

Quoting Imre Deak (2017-11-02 13:38:09)
> Doing modeset on internal panels may have a considerable overhead due to
> the panel specific power sequencing delays. To avoid long test runtimes
> in the CI fast-feedback test split out the testing of internal panels
> from the plane modeset subtests. Create fast and slow versions of these
> new subtests. In the fast one only combinations with all enabled, all
> planes disabled or a single plane enable are tested. In the slow one all
> plane combinations are tested.

> @@ -528,6 +529,10 @@ run_transition_test(igt_display_t *display, enum pipe pipe, igt_output_t *output
>         }
>  
>         for (i = 0; i < iter_max; i++) {
> +               if (type == TRANSITION_MODESET_PLANES_FAST &&
> +                   hweight32(i) != 1 && hweight32(i) != pipe_obj->n_planes)

So reduce number of iterations to a power of two, and only operate if
pipe_obj->n_planes == 1

Why repeat hweight32(i) when you've already proved it is 1? That reads
very fishily.
-Chris