[Intel-gfx] [PATCH] i-g-t/tests: Drop gem_seqno_wrap, gem_pin, gem_hangcheck_forcewake
Antonio Argenziano
antonio.argenziano at intel.com
Tue Oct 10 17:12:17 UTC 2017
On 10/10/17 01:55, Abdiel Janulgue wrote:
> This improves the GEM tests section of I-G-T to make it more
> suitable for CI testing
Can you provide a little more details on what is the rationale behind
this choice. Are the tests being removed only because they do not fit
the CI guidelines or is it because they do not offer any valuable coverage?
Maybe having three separate patches, one per test would be better in my
opinion since the tests look to have not much in common.
-Antonio
More information about the Intel-gfx
mailing list