[Intel-gfx] [igt-dev] [PATCH i-g-t] igt/pm_rpm: Close local fd before trying to unload module
Antonio Argenziano
antonio.argenziano at intel.com
Fri Aug 17 18:27:57 UTC 2018
On 17/08/18 10:49, Chris Wilson wrote:
> Quoting Antonio Argenziano (2018-08-17 18:29:09)
>>
>>
>> On 15/08/18 02:25, Chris Wilson wrote:
>>> Fixes: d8e78990aa2b ("igt/pm_rpm: Test reaquisition of runtime-pm after module reload")
>>> Signed-off-by: Chris Wilson <chris at chris-wilson.co.uk>
>>> ---
>>> tests/pm_rpm.c | 2 ++
>>> 1 file changed, 2 insertions(+)
>>>
>>> diff --git a/tests/pm_rpm.c b/tests/pm_rpm.c
>>> index 65489bcdb..a4f9f783e 100644
>>> --- a/tests/pm_rpm.c
>>> +++ b/tests/pm_rpm.c
>>> @@ -2034,6 +2034,8 @@ int main(int argc, char *argv[])
>>> teardown_environment();
>>>
>>> igt_subtest("module-reload") {
>>> + teardown_environment();
>>
>> There is already a fixture with a call to 'teardown_environment()'
>> surrounding this test, is it missing a couple of subtests groups?
>
> It was intended for sequential execution (and I had forgotten that I had
> purposely placed it after the teardown_environment -- the confusion was
> caused by teardown_environment being incomplete). Adding a subtest group
> for the preceding bunch would have the debatable consequence of module-
> reload reporting a FAIL if something else caused a wakeref leak. My
> opinion is to prefer SKIP for external artefacts so that it is clear when
> a test failed of its own accord (and so be useful for debugging). It just
> so happens that this test was to reproduce the trigger for the external
> failures elsewhere and so detect the wakeref leak.
Agreed. Maybe a comment would help, your choice.
Reviewed-by: Antonio Argenziano <antonio.argenziano at intel.com>
> -Chris
>
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