[Intel-xe] [drm-xe:drm-xe-next 1709/1927] htmldocs: Warning: /sys/devices/.../hwmon/hwmon<i>/curr1_crit is defined 2 times: ./Documentation/ABI/testing/sysfs-driver-intel-xe-hwmon:35 ./Documentation/ABI/testing/sysfs-driver-intel-i915-hwmon:52

[kernel test robot]

tree:   https://gitlab.freedesktop.org/drm/xe/kernel.git drm-xe-next
head:   b3890fb4386dcef68a96888141c4cc773f6241ce
commit: 052cd881aa7a198a510bbbd94fd1859c497c75f8 [1709/1927] drm/xe/hwmon: Expose card reactive critical power
reproduce: (https://download.01.org/0day-ci/archive/20231111/202311112157.QOcNbbvO-lkp@intel.com/reproduce)

If you fix the issue in a separate patch/commit (i.e. not just a new version of
the same patch/commit), kindly add following tags
| Reported-by: kernel test robot <lkp at intel.com>
| Closes: https://lore.kernel.org/oe-kbuild-all/202311112157.QOcNbbvO-lkp@intel.com/

All warnings (new ones prefixed by >>):

>> Warning: /sys/devices/.../hwmon/hwmon<i>/curr1_crit is defined 2 times:  ./Documentation/ABI/testing/sysfs-driver-intel-xe-hwmon:35  ./Documentation/ABI/testing/sysfs-driver-intel-i915-hwmon:52
>> Warning: /sys/devices/.../hwmon/hwmon<i>/power1_crit is defined 2 times:  ./Documentation/ABI/testing/sysfs-driver-intel-xe-hwmon:22  ./Documentation/ABI/testing/sysfs-driver-intel-i915-hwmon:39

-- 
0-DAY CI Kernel Test Service
https://github.com/intel/lkp-tests/wiki