[Pixman] [cairo] pixman: New ARM NEON optimizations

Benjamin Otte otte at redhat.com
Tue Feb 16 08:18:27 PST 2010

On Tue, 2010-02-16 at 17:56 +0200, Siarhei Siamashka wrote:
> The problem of cairo-perf-trace is that it does not cover 16bpp desktop color
> depth well which is still used on a lot of ARM devices.  Also a lot of the
> standard tests run too long and are very memory hungry ('ocitysmap' test is
> even practically impossible to run on this hardware due to excessive
> swapping).
I think we'd all be happy if there were some real-life tests recorded on
embedded hardware so we're able to measure that workload, too.

The hard part here is of course figuring out the proper things to test,
the rest is just running cairo-trace (I'm assuming that one just works
on ARM?) and uploading the results.


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