[igt-dev] [PATCH] RFC: tests/kms_setmode: rename subtest to simplify test combinations

B, Jeevan jeevan.b at intel.com
Mon Aug 28 05:29:00 UTC 2023


> -----Original Message-----
> From: Deak, Imre <imre.deak at intel.com>
> Sent: Sunday, August 27, 2023 11:33 PM
> To: B, Jeevan <jeevan.b at intel.com>
> Cc: igt-dev at lists.freedesktop.org
> Subject: Re: [PATCH] RFC: tests/kms_setmode: rename subtest to simplify
> test combinations
> 
> On Mon, Aug 14, 2023 at 01:35:27PM +0530, Jeevan B wrote:
> > Both 'basic-clone-single-crtc' and 'invalid-clone-single-crtc' tests
> > aim to assess a scenario where two connectors are attempted to be run
> > with a single CRTC, which is not feasible.  Consequently, the  'basic-clone-
> single-crtc'
> > test is marked as invalid and skipped due to the impractical scenario.
> > On the other hand, the 'invalid-clone-single-crtc' test serves as a
> > negative scenario, confirming the failure of the 'ioctl' and indicating a
> successful test.
> >
> > similarly, the 'invalid-clone-exclusive-crtc' test attempts to run two
> > connectors with two CRTCs, which is indeed possible, rendering the test
> nonsensical.
> > Consequently, the 'clone-exclusive-crtc' test runs and passes as expected.
> >

Thanks for the inputs. Will work on the comments given. .

> > Signed-off-by: Jeevan B <jeevan.b at intel.com>
> > Cc: Imre Deak <imre.deak at intel.com>
> > ---
> >  tests/kms_setmode.c | 6 +-----
> >  1 file changed, 1 insertion(+), 5 deletions(-)
> >
> > diff --git a/tests/kms_setmode.c b/tests/kms_setmode.c index
> > 035bbd0b0..0c65e3937 100644
> > --- a/tests/kms_setmode.c
> > +++ b/tests/kms_setmode.c
> > @@ -932,12 +932,8 @@ igt_main_args("det:", NULL, help_str,
> opt_handler, NULL)
> >  		const char *name;
> >  	} tests[] = {
> >  		{ TEST_TIMINGS, "basic" },
> > -		{ TEST_CLONE | TEST_SINGLE_CRTC_CLONE,
> > -					"basic-clone-single-crtc" },
> 
> It is feasible to use a single CRTC with two connectors, for instance in case of
> a VGA and an HDMI connector; so this subtest can't be removed.
> 
> >  		{ TEST_INVALID | TEST_CLONE | TEST_SINGLE_CRTC_CLONE,
> > -					"invalid-clone-single-crtc" },
> > -		{ TEST_INVALID | TEST_CLONE |
> TEST_EXCLUSIVE_CRTC_CLONE,
> 
> There are invalid configurations when each connector uses its own CRTC, for
> instance when a connector uses a CRTC not compatible with the connector.
> So this subtest can't be removed either.
> 
> I suppose you're fixing a problem where a subtest is failing if there are no
> dynamic tests defined for it, on some platforms. In that case the subtest
> should be made to pass explicitly, perhaps by ensuring that there is at least
> one dynamic test defined for each subtest.
> 
> > -					"invalid-clone-exclusive-crtc" },
> > +					"clone-single-crtc-negative" },
> >  		{ TEST_CLONE | TEST_EXCLUSIVE_CRTC_CLONE,
> >  					"clone-exclusive-crtc" },
> >  		{ TEST_INVALID | TEST_CLONE | TEST_SINGLE_CRTC_CLONE
> |
> > TEST_STEALING,
> > --
> > 2.25.1
> >


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