[PATCH v1] tests/intel: Remove TEST field from test documentation
Piecielska, Katarzyna
katarzyna.piecielska at intel.com
Fri Dec 20 15:14:13 UTC 2024
Each test should contain only one TEST field.
Add the Functionality field in the TEST section to fix the warnings during the addition of subtests.
Signed-off-by: Pravalika Gurram <pravalika.gurram at intel.com>
---
tests/intel/xe_vm.c | 10 +---------
1 file changed, 1 insertion(+), 9 deletions(-)
diff --git a/tests/intel/xe_vm.c b/tests/intel/xe_vm.c index b10269191..b5519c9fc 100644
--- a/tests/intel/xe_vm.c
+++ b/tests/intel/xe_vm.c
@@ -8,6 +8,7 @@
* Category: Core
* Mega feature: General Core features
* Sub-category: VMA
+ * Functionality: ioctl
There is no need to add functionality here. Each subtest has it.
Rest looks good.
After changing that:
Reviewed-by: Katarzyna Piecielska <katarzyna.piecielska at intel.com>
*/
#include "igt.h"
@@ -2247,15 +2248,6 @@ static void bind_flag_invalid(int fd)
xe_vm_destroy(fd, vm);
}
-/**
- * TEST: Negative test for vm create/destroy ioctl
- * Category: Core
- * Mega feature: General Core features
- * Sub-category: Synchronization
- * Functionality: vm create
- * Test category: negative test
- */
-
/**
* SUBTEST: invalid-flag-%s
* Description: function %arg[1] used in vm create IOCTL to make it fail
--
2.34.1
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