[Intel-gfx] [PATCH i-g-t v3] tests/gem_flink_basic: Add documentation for subtests

[Szwichtenberg, Radoslaw]

On Thu, 2017-09-14 at 11:09 -0700, Vinay Belgaumkar wrote:
> Added the missing IGT_TEST_DESCRIPTION and some subtest
> descriptions.
> 
> v2: Removed duplication, addressed comments, cc'd test author
> 
> v3: Only comment abstract code, change some igt_info to igt_debug.
>     Changed description to reflect this is a patch, not an RFC.
> 
> Cc: Michał Winiarski <michal.winiarski at intel.com>
> Cc: Eric Anholt <eric at anholt.net>
> Cc: Arkadiusz Hiler <arkadiusz.hiler at intel.com>
> Cc: Daniel Vetter <daniel.vetter at intel.com>
> 
> Signed-off-by: Vinay Belgaumkar <vinay.belgaumkar at intel.com>

LGTM
Reviewed-by: Radoslaw Szwichtenberg <radoslaw.szwichtenberg at intel.com>