[Intel-gfx] [PATCH i-g-t v3] tests/gem_flink_basic: Add documentation for subtests

[Szwichtenberg, Radoslaw]

On Fri, 2017-09-15 at 07:34 +0000, Szwichtenberg, Radoslaw wrote:
> On Thu, 2017-09-14 at 11:09 -0700, Vinay Belgaumkar wrote:
> > Added the missing IGT_TEST_DESCRIPTION and some subtest
> > descriptions.
> > 
> > v2: Removed duplication, addressed comments, cc'd test author
> > 
> > v3: Only comment abstract code, change some igt_info to igt_debug.
> >     Changed description to reflect this is a patch, not an RFC.
> > 
> > Cc: Michał Winiarski <michal.winiarski at intel.com>
> > Cc: Eric Anholt <eric at anholt.net>
> > Cc: Arkadiusz Hiler <arkadiusz.hiler at intel.com>
> > Cc: Daniel Vetter <daniel.vetter at intel.com>
> > 
> > Signed-off-by: Vinay Belgaumkar <vinay.belgaumkar at intel.com>
> 
> LGTM
> Reviewed-by: Radoslaw Szwichtenberg <radoslaw.szwichtenberg at intel.com>
> 
Maybe just one minor with the comment style - it would be good to make it
consistent across whole file. Let's start comment with a capital letter and
finish it with a dot.

Still - my r-b is yours :)
-Radek